AF与ECM/SIR都是(shi)一(yi)个电(dian)(dian)(dian)化学过(guo)程；从产生的(de)(de)(de)条件(jian)来看（都需要符(fu)合(he)下面3个条件(jian)）：电(dian)(dian)(dian)解液环境，即(ji)湿度与离子（Electrolyte–humidityandionicspecies）；施加偏压(ya)（Voltagebias–Forcethatdrivesthereaction）;存(cun)在(zai)离子迁移的(de)(de)(de)通(tong)道意(yi)味(wei)着(zhe)玻纤与树(shu)脂的(de)(de)(de)结合(he)间存(cun)在(zai)缺陷，或线(xian)(xian)与线(xian)(xian)间存(cun)在(zai)杂物等；（“Pathway”–Awayfortheionstomovefromtheanodetothecathode；Thepathwayisalongtheglassfiberswhentheresinimpregnationtotheglassfibershavedefects）；加剧(ju)其产生的(de)(de)(de)条件(jian)类似：高湿环境（Highhumidityrate）；高电(dian)(dian)(dian)压(ya)（HigherVoltagelevels）；高温环境（Highertemperature）；四线(xian)(xian)法的(de)(de)(de)基(ji)本(ben)原理在(zai)于通(tong)过(guo)将电(dian)(dian)(dian)流引入被测件(jian)的(de)(de)(de)两(liang)(liang)个端(duan)点，并通(tong)过(guo)另外两(liang)(liang)根单独的(de)(de)(de)引线(xian)(xian)在(zai)被测件(jian)的(de)(de)(de)两(liang)(liang)端(duan)测量电(dian)(dian)(dian)压(ya)。贵州智能(neng)电(dian)(dian)(dian)阻测试直销价

多(duo)(duo)功(gong)(gong)能(neng)(neng)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)是一种(zhong)集(ji)成(cheng)了(le)多(duo)(duo)种(zhong)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)功(gong)(gong)能(neng)(neng)的(de)(de)设(she)(she)备(bei)(bei)(bei)，可以(yi)同时进行(xing)多(duo)(duo)种(zhong)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)。它可以(yi)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)量电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)的(de)(de)值、温(wen)度系数(shu)、电(dian)(dian)(dian)(dian)(dian)(dian)压系数(shu)等多(duo)(duo)个(ge)参数(shu)，同时还可以(yi)进行(xing)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)的(de)(de)快速(su)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)、自动测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)等。这种(zhong)设(she)(she)备(bei)(bei)(bei)的(de)(de)出现(xian)，提(ti)高了(le)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)的(de)(de)效率和准确性(xing)，为电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)产(chan)(chan)品(pin)的(de)(de)质(zhi)量控制提(ti)供了(le)有力(li)的(de)(de)支持。多(duo)(duo)功(gong)(gong)能(neng)(neng)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)在电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)行(xing)业(ye)中的(de)(de)应(ying)用前景广(guang)阔(kuo)。随(sui)着(zhe)电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)产(chan)(chan)品(pin)的(de)(de)不断更新换代，对电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)的(de)(de)要求也(ye)越(yue)来越(yue)高。传统的(de)(de)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)只能(neng)(neng)进行(xing)简单的(de)(de)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)量，无法(fa)满(man)足(zu)复杂(za)电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)产(chan)(chan)品(pin)的(de)(de)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)需求。而多(duo)(duo)功(gong)(gong)能(neng)(neng)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)可以(yi)满(man)足(zu)不同电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)产(chan)(chan)品(pin)的(de)(de)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)要求，包括手(shou)机、电(dian)(dian)(dian)(dian)(dian)(dian)脑、汽车电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)等各(ge)个(ge)领域(yu)。因此，多(duo)(duo)功(gong)(gong)能(neng)(neng)电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)在电(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)(zi)行(xing)业(ye)中的(de)(de)应(ying)用前景非常广(guang)阔(kuo)。广(guang)西电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)推荐货源电(dian)(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)(ce)(ce)(ce)(ce)(ce)(ce)(ce)试(shi)(shi)(shi)设(she)(she)备(bei)(bei)(bei)比较(jiao)复杂(za)。

PCB离(li)子迁移(yi)(yi)绝缘电(dian)(dian)(dian)阻(zu)测试是(shi)一项重要(yao)(yao)的(de)(de)(de)(de)(de)测试方法，用(yong)于评估PCB板的(de)(de)(de)(de)(de)绝缘性(xing)(xing)能(neng)(neng)。在电(dian)(dian)(dian)子产(chan)(chan)品制(zhi)造(zao)过程中，PCB板的(de)(de)(de)(de)(de)绝缘性(xing)(xing)能(neng)(neng)是(shi)至关重要(yao)(yao)的(de)(de)(de)(de)(de)，它直接影响着产(chan)(chan)品的(de)(de)(de)(de)(de)可(ke)靠(kao)性(xing)(xing)和安(an)全性(xing)(xing)。因此，进行PCB离(li)子迁移(yi)(yi)绝缘电(dian)(dian)(dian)阻(zu)测试是(shi)必不可(ke)少的(de)(de)(de)(de)(de)。PCB离(li)子迁移(yi)(yi)是(shi)指在电(dian)(dian)(dian)场作用(yong)下(xia)(xia)，PCB板表(biao)面(mian)的(de)(de)(de)(de)(de)离(li)子会迁移(yi)(yi)到其(qi)他位置，导致(zhi)电(dian)(dian)(dian)路短路或绝缘性(xing)(xing)能(neng)(neng)下(xia)(xia)降。这(zhei)种(zhong)现(xian)象主要(yao)(yao)是(shi)由于PCB板表(biao)面(mian)的(de)(de)(de)(de)(de)污染物(wu)引起的(de)(de)(de)(de)(de)，例如油污、灰尘(chen)、水分(fen)等。当这(zhei)些污染物(wu)存在时，它们会在电(dian)(dian)(dian)场的(de)(de)(de)(de)(de)作用(yong)下(xia)(xia)形成离(li)子，进而(er)迁移(yi)(yi)到其(qi)他位置，导致(zhi)电(dian)(dian)(dian)路短路或绝缘性(xing)(xing)能(neng)(neng)下(xia)(xia)降。

10、在(zai)(zai)500小(xiao)(xiao)时(shi)的(de)偏压加(jia)载后，可以进(jin)行额外的(de)T/H/B条件(jian)。然而，**少(shao)要(yao)进(jin)行500小(xiao)(xiao)时(shi)加(jia)载偏置(zhi)电压的(de)测(ce)(ce)(ce)试，来作为(wei)CAF测(ce)(ce)(ce)试的(de)结果之一(yi)。11、在(zai)(zai)确(que)定(ding)为(wei)CAF失(shi)效(xiao)之前(qian)，应该确(que)认连(lian)接(jie)线两端的(de)电阻(zu)(zu)是(shi)不是(shi)要(yao)小(xiao)(xiao)于菊(ju)花(hua)链(lian)区(qu)域的(de)电阻(zu)(zu)。做(zuo)法(fa)是(shi)将菊(ju)花(hua)链(lian)附近(jin)连(lian)接(jie)测(ce)(ce)(ce)试线缆的(de)线路切断。所有的(de)测(ce)(ce)(ce)试结束后，如果发现某块测(ce)(ce)(ce)试板连(lian)接(jie)线两端的(de)电阻(zu)(zu)确(que)实小(xiao)(xiao)于菊(ju)花(hua)链(lian)区(qu)域的(de)电阻(zu)(zu)，那么这块测(ce)(ce)(ce)试板就不能作为(wei)数据分(fen)析(xi)的(de)依据。常(chang)规结果判定(ding)：1.96小(xiao)(xiao)时(shi)静置(zhi)后绝(jue)缘电阻(zu)(zu)R1≤107欧姆，即判定(ding)样本失(shi)效(xiao)；2.当**终测(ce)(ce)(ce)试绝(jue)缘电阻(zu)(zu)R2<108欧姆，或(huo)者在(zai)(zai)测(ce)(ce)(ce)试过程中有3次记录或(huo)以上出现R2<108欧姆即判定(ding)样本失(shi)效(xiao)。传统的(de)电阻(zu)(zu)器件(jian)在(zai)(zai)测(ce)(ce)(ce)量电阻(zu)(zu)时(shi)可能存在(zai)(zai)一(yi)定(ding)的(de)误差。

NO.3PCB制程(cheng)钻(zuan)孔钻(zuan)孔参(can)(can)数(shu)(shu)不(bu)当或钻(zuan)针研磨次数(shu)(shu)太多(duo)会(hui)导致孔壁表面(mian)凹凸起(qi)伏大。在(zai)化(hua)学湿(shi)加工过程(cheng)中，表面(mian)凹陷之处易(yi)聚(ju)集(ji)或包覆金属盐类溶液，易(yi)渗入到薄弱结合(he)部(bu)的(de)(de)细微裂缝中，从而导致出现(xian)CAF的(de)(de)可靠性(xing)问题(ti)。因(yin)此需(xu)选择(ze)(ze)较合(he)适(shi)的(de)(de)钻(zuan)孔参(can)(can)数(shu)(shu)和较新(xin)的(de)(de)钻(zuan)针，以(yi)确(que)保(bao)钻(zuan)孔的(de)(de)质量(liang)。除胶(jiao)渣除胶(jiao)渣若参(can)(can)数(shu)(shu)选择(ze)(ze)不(bu)当，除胶(jiao)不(bu)净会(hui)影响(xiang)电镀的(de)(de)质量(liang)，增(zeng)加CAF失(shi)效的(de)(de)机(ji)会(hui)。因(yin)此根据不(bu)同类型材(cai)料需(xu)选择(ze)(ze)合(he)适(shi)的(de)(de)除胶(jiao)参(can)(can)数(shu)(shu)。压合(he)需(xu)要(yao)选择(ze)(ze)合(he)适(shi)的(de)(de)压合(he)程(cheng)序，尤其是多(duo)层(ceng)板要(yao)注(zhu)意层(ceng)压参(can)(can)数(shu)(shu)的(de)(de)匹配性(xing)，确(que)保(bao)压合(he)的(de)(de)质量(liang)。离(li)子在(zai)单位强度(du)(V/m)电场作用下的(de)(de)移动速(su)度(du)称之为离(li)子迁(qian)移率，它是分(fen)辨(bian)被测离(li)子直径大小的(de)(de)一个重(zhong)要(yao)参(can)(can)数(shu)(shu)。江苏国内(nei)电阻(zu)测试(shi)系统解决方案

通过(guo)表面绝缘电阻(zu)（SIR）测试数据可以直(zhi)接反映PCB的清(qing)洁度。贵州智能电阻(zu)测试直(zhi)销(xiao)价

电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)量仪是一种专门用(yong)(yong)于测(ce)量电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)值的(de)仪器。它(ta)通过(guo)将(jiang)待测(ce)电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)与(yu)已(yi)知电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)进行比较，从(cong)而得到准(zhun)确的(de)电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)值。电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)量仪具(ju)有(you)(you)高精度、快(kuai)速测(ce)量的(de)特点(dian)，适(shi)用(yong)(yong)于各种电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)值的(de)测(ce)量。电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)夹(jia)具(ju)是一种用(yong)(yong)于固定和连接电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)的(de)工具(ju)。它(ta)通常由导电(dian)(dian)(dian)(dian)(dian)材料制成(cheng)，具(ju)有(you)(you)良好的(de)导电(dian)(dian)(dian)(dian)(dian)性能和稳定的(de)连接效果(guo)。电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)夹(jia)具(ju)可(ke)以帮助工程师(shi)快(kuai)速、准(zhun)确地进行电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)，提高工作效率。选择(ze)(ze)电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)配(pei)件时，首(shou)先要考(kao)虑(lv)其(qi)准(zhun)确性。准(zhun)确的(de)测(ce)试(shi)结果(guo)对于电(dian)(dian)(dian)(dian)(dian)子产品的(de)制造和维(wei)修(xiu)至关重要，因此需(xu)要选择(ze)(ze)具(ju)有(you)(you)高精度的(de)电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)配(pei)件。贵(gui)州(zhou)智能电(dian)(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)测(ce)试(shi)直销(xiao)价(jia)

本文来自(zi)海(hai)润(run)达物联科技(ji)有限责(ze)任(ren)公司(si)：//qfd1mz.cn/Article/93c07599831.html